Binet-Simon Scale

 

 

 

When: Developed in 1905, revised in 1908 and 1911

Who: Alfred Binet and Theodore Simon

Alfred Binet (1857-1911)

 

Significance it had within child psychology:

Alfred Binet and Theodore Simon believed intelligence to be a learned entity. This test was formed in order to measure intelligence of children in accordance with their age. The test was used and varied among children from the ages of 3 years to 12 years. (Binet & Simon, 1905) Alfred Binet and Theodore Simon believed that children had a different form of intelligence than adults; therefore, they needed to be measured in a different way. With this scale they attempted to create a test which was standardized and would allow for the measurement of a child’s intelligence in the present. This scale was originally created with the intent of classifying children as a means for them to receive special education; however, over time developed into a measurement of intelligence for all children.

Test format:

Subtests within the Binet-Simon measure include:   

1905

1908

·         Reply to an abstract question

·         Repetition of three figures; Immediate repetition of figures

·         Definitions of abstract terms

·         Verbal definition of known objects

·         Resemblances of several known objects given from memory

 

·         Unfinished pictures

·         Comprehension questions

·         Definition of familiar objects

·         Making change from 20 sous (French money)

 The score of a child was based on his or her composite score across various tests. The emphasis here is on quantity of tests. Binet believed that one could not make solid conclusions about intelligence by only looking at how children score on one test. (Boake, 2002)

Levels of Classification:

Average: mental age matches chronological age

Advanced: mental age is higher than chronological age

Retarded: mental age is lower than chronological age

 

 

Intelligence Testing          Stanford-Binet Scale               WISC               References

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